Technical Marketplace | Quantum ecosystem

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Quantum PICs characterization

Qu-Test

AIT Austrian Institute of Technology

Quantum Source Design and Prototyping

Qu-Test

Fraunhofer IOF

Qubit-compatible In flip-chip bonding

Qu-Pilot

VTT-Technical Research Centre of Finland Ltd

Security Verification

Qu-Test

Fraunhofer IOF

SiN platform for Ultra-low loss passive components

Qu-Pilot

CEA

SiN Platform-low loss

Qu-Pilot

IMEC

Single layer metal patterning for BEOL

Qu-Pilot

CEA

Single layer metal patterning for BEOL

Qu-Pilot

Fraunhofer Institute for Photonic Microsystems IPMS

SOI platform for passive and active components

Qu-Pilot

CEA

Spin-qubit device screening

Qu-Test

TNO

Sputtered TiN, NbN metallization

Qu-Pilot

VTT-Technical Research Centre of Finland Ltd

Sub-shot-noise microscope

Qu-Test

INRiM Istituto Nazionale di Ricerca Metrologica

Superconducting Electrodes in CoSi2

Qu-Pilot

CEA

Superconducting qubit testing

Qu-Test

TNO

SWIR Single Photon Detectors

Qu-Pilot

Fraunhofer HHI

Telecom single-photon detector characterization

Qu-Test

Fraunhofer IOF

Telecom single-photon detector characterization

Qu-Test

Fraunhofer IAF

Telecom single-photon detector characterization

Qu-Test

INRiM Istituto Nazionale di Ricerca Metrologica

Telecom single-photon detector characterization

Qu-Test

Physikalisch-Technische Bundesanstalt

Thick SOI platform for passive & active components

Qu-Pilot

VTT-Technical Research Centre of Finland Ltd

Thin Film Lithium Niobate PICs

Qu-Pilot

Fraunhofer HHI

Thin SOI Platfrom

Qu-Pilot

IMEC

Two-photon source characterisation

Qu-Test

INRiM Istituto Nazionale di Ricerca Metrologica

Underground low-noise environment

Qu-Test

Institut d'Optique Théorique et Appliquée

VIS-NIR Photonic integrated circuit in Si(O)N

Qu-Pilot

FBK

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