Characterization of superconducting parametric amp

Qu-Test

INRiM Istituto Nazionale di Ricerca Metrologica

Characterization of superconducting parametric amp

Qu-Test

Physikalisch-Technische Bundesanstalt

Characterization of superconducting resonators

Qu-Test

VTT-Technical Research Centre of Finland Ltd

III-V photodetector characterisation

Qu-Test

Fraunhofer IAF

Ion Traps Characterization

Qu-Test

Physikalisch-Technische Bundesanstalt

Litho test structures for quantum manufacturing

Qu-Pilot

CSIC

Low Temperature Characterization of color centers

Qu-Pilot

Manhattan junctions

Qu-Pilot

VTT-Technical Research Centre of Finland Ltd

Metrological assessment of Integrated Lasers

Qu-Test

INRiM Istituto Nazionale di Ricerca Metrologica

Metrological DV/CV QKD component assessment

Qu-Test

Physikalisch-Technische Bundesanstalt

Metrological evaluation of atomic clocks

Qu-Test

Physikalisch-Technische Bundesanstalt

Metrological evaluation of Atomic Clocks

Qu-Test

INRiM Istituto Nazionale di Ricerca Metrologica

Metrological evaluation of Atomic Clocks

Qu-Test

Observatoire de Paris

Microgravity platform

Qu-Test

Institut d'Optique Théorique et Appliquée

MIR Scanning Microscopy with Undetected Light

Qu-Test

Fraunhofer IOF

Nb resonators

Qu-Pilot

IMEC

Nb resonators and qubit electrodes

Qu-Pilot

VTT-Technical Research Centre of Finland Ltd

Nb/Ta resonators and qubit electrodes

Qu-Pilot

VTT-Technical Research Centre of Finland Ltd

NbTiN devices

Qu-Pilot

FBK

Non-invasive gradiometry

Qu-Test

Institut d'Optique Théorique et Appliquée

Optical Ground Station

Qu-Test

Fraunhofer IOF

Packaging of photonic integrated circuits

Qu-Test

VTT-Technical Research Centre of Finland Ltd

PAM Characterization, Design and Prototyping

Qu-Test

Fraunhofer IOF

Phase noise in microwaves

Qu-Test

INRiM Istituto Nazionale di Ricerca Metrologica

Planar micromagnet fabrication

Qu-Pilot

Fraunhofer Institute for Photonic Microsystems IPMS