Diamond structuring

Qu-Pilot

Fraunhofer IAF

DV QKD testbench

Qu-Test

VTT-Technical Research Centre of Finland Ltd

DV QKD testbench

Qu-Test

INRiM Istituto Nazionale di Ricerca Metrologica

DV QKD testbench

Qu-Test

Fraunhofer IOF

DV QKD testbench

Qu-Test

AIT Austrian Institute of Technology

Electrodes on diamonds

Qu-Pilot

TNO

Fabrication and Testing of Warm Rb-Based MEMS Cell

Qu-Test

INRiM Istituto Nazionale di Ricerca Metrologica

Fabrication of III-V APDs and SPADs

Qu-Pilot

Fraunhofer IAF

FIB fabrication of Si and Ge color centers

Qu-Pilot

FBK

Fiber Link

Qu-Test

Fraunhofer IOF

Fiber link testbeds

Qu-Test

Physikalisch-Technische Bundesanstalt

Fiber Pigtailing

Qu-Pilot

Fraunhofer IOF

Flip-chip bonding

Qu-Pilot

VTT-Technical Research Centre of Finland Ltd

Fluorescence Lifetime Microscopy

Qu-Test

Fraunhofer IOF

Free-Space Quantum Communication Link

Qu-Test

Fraunhofer IOF

Hybrid InP/SiN Photonic Integrated Circuits

Qu-Pilot

Fraunhofer HHI

Hybrid Quantum Link

Qu-Test

Fraunhofer IOF

Characterization of Diamond-Based Qubits

Qu-Test

Characterization of Entangled Photon Pair Sources

Qu-Test

Fraunhofer IOF

Characterization of optically pumped magnetometers

Qu-Test

Physikalisch-Technische Bundesanstalt

Characterization of photonic integrated circuits

Qu-Test

Fraunhofer IOF

Characterization of photonic integrated circuits

Qu-Test

VTT-Technical Research Centre of Finland Ltd

Characterization of SNSPD by PNR Detection

Qu-Test

Fraunhofer IOF

Characterization of superconducting parametric amp

Qu-Test

TNO

Characterization of superconducting parametric amp

Qu-Test

INRiM Istituto Nazionale di Ricerca Metrologica