Characterization of entangled photon pair sources (EPPS) regarding the most important properties for applications in quantum technologies is offered. In addition, each measured parameter of the characterization is compared to a benchmark of IOF EPPSs. This provides the customer with a direct comparison of the performance of his tested EPPS compared to other EPPSs within the IOF library. The EPPSs that can be characterized at IOF are polarization, frequency bin and time bin entangled photon pair sources. Field of Application and applied technology => Quantum Technologies: • SNSPD (780 - 900nm, 1200 - 1700nm) • SPAD (600 - 900nm) • Ultra-low jitter time tagging unit • Spectrometer (OSA) • Monochromator • Polarization analysis Module (PAM).