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Cryo DC characterization of 200mm and 300mm wafers
Organization name
Fraunhofer IAF
Service
Qu-Test
Description
Complete DC on wafer measurement characterization of 200mm and 300mm wafers up to 2K with the following technical specifications: • Optical pattern recognition for probing • Base temperature chuck
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Document 1
Document 2
Applications
Computing
TRL
Platform
Superconducting
Offering type
Testing
Measurements
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