Testing of a packaged few-dot spin-qubit device. We support direct-current, reflectometry and on-chip resonators, as well as single-axis external magnetic field up to 2T. Measurement capacity includes all-to-all leakage, formation of sensing dots and QPCs, charge noise, tuning 3-4 dot array to a single-electron regime with virtual gate matrices. A setup with a capacity to apply baseband and microwave control pulses. Reflectometry measurements up to 350MHz. Capacity to apply up to 40 DC gate voltages, and rapid sweeps for up to 24 gate voltages. Application of baseband pulses on up to 7-9 lines and optional pulsed microwave drive.