The setup of characterization of Photonic Integrated Circuits (PICs) is offered with high resolution digital microscope and precised alignment of optical fibers and electrical probes. It has the horizontal and vertical input/output coupling and various range of low frequency probes, DC Wedges (DC probe array) and high frequency probes. Transmission measurements available by using tunable lasers, OSA, and high precision detectors (SNSPDs) at telecom and 800nm wavelengths. Characterization of active components like modulators and detectors also available using high speed equipment. This opto-electronic probe station is adopted to test and characterize quantum PICs.